Sybren Sijbrandij has focused on the development of scientific instrumentation both during his pursuit of degrees in Applied Physics (M.Sc., University of Groningen) and Materials Science (D.Phil., University of Oxford), and during his career. In his current roles as a scientist and occasional program manager at Carl Zeiss Microscopy, he works on advancing the capabilities of the helium ion microscope. Relevant areas of expertise include ion source technology, charged particle optics, imaging detectors and analytical detectors. (...) Read more
Title of his talk
"Recent Developments in Helium and Neon Ion Microscopy Instrumentation"